Sub-half-micron silicon pattern generation by electron beam direct writing on polysilane films

被引:0
|
作者
Okamoto, Katsuhiko [1 ]
Shin, Hidetoshi [1 ]
Shiba, Kazutoshi [1 ]
Miyazaki, Seiichi [1 ]
Hirose, Masataka [1 ]
机构
[1] Hiroshima Univ, Hiroshima, Japan
来源
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 12 B期
关键词
8;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:4441 / 4443
相关论文
共 50 条
  • [1] SUB-HALF-MICRON SILICON PATTERN GENERATION BY ELECTRON-BEAM DIRECT WRITING ON POLYSILANE FILMS
    OKAMOTO, K
    SHIN, H
    SHIBA, K
    MIYAZAKI, S
    HIROSE, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12B): : 4441 - 4443
  • [2] Electron beam direct writing techniques for the development of sub-quarter-micron devices
    Fujino, T
    Maeda, H
    Kimura, Y
    Horibe, H
    Imanaga, Y
    Shinkawata, H
    Nakao, S
    Kato, T
    Matsui, Y
    Hirayama, M
    Yasuoka, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (12A): : 6320 - 6327
  • [3] INVESTIGATION OF THE PROCESS LATITUDE FOR SUB-HALF-MICRON PATTERN REPLICATION IN X-RAY-LITHOGRAPHY
    OERTEL, HK
    WEISS, M
    HUBER, HL
    MICROELECTRONIC ENGINEERING, 1991, 13 (1-4) : 339 - 342
  • [4] AN ADVANCED ELECTRON-BEAM LITHOGRAPHY SYSTEM FOR SUB-HALF-MICRON ULTRA-LARGE-SCALE PRODUCTION - THE DISTORTION CORRECTOR TECHNOLOGY
    NAKAMURA, K
    OKINO, T
    NAKANODA, S
    KAWAMURA, I
    GOTO, N
    NAKAGAWA, Y
    THOMPSON, W
    SHEARER, MH
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06): : 1903 - 1908
  • [5] Novel electron beam direct writing technique for the hole pattern of quarter-micron devices
    Fujino, Takeshi
    Ishii, Atsushi
    Kawai, Kenji
    Matsuba, Motoko
    Nakao, Shuji
    Watakabe, Yaichiro
    Akasaka, Yoichi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1992, 31 (12 B): : 4262 - 4267
  • [6] NOVEL ELECTRON-BEAM DIRECT WRITING TECHNIQUE FOR THE HOLE PATTERN OF QUARTER-MICRON DEVICES
    FUJINO, T
    ISHII, A
    KAWAI, K
    MATSUBA, M
    NAKAO, S
    WATAKABE, Y
    AKASAKA, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12B): : 4262 - 4267
  • [7] DYNAMIC BEHAVIOR OF PHOTOCARRIERS IN A GAAS METAL-SEMICONDUCTOR-METAL PHOTODETECTOR WITH SUB-HALF-MICRON ELECTRODE PATTERN
    KOSCIELNIAK, WC
    PELOUARD, JL
    LITTLEJOHN, MA
    APPLIED PHYSICS LETTERS, 1989, 54 (06) : 567 - 569
  • [8] PATTERN FIDELITY IN SUB-MICRON LITHOGRAPHY WITH A RECTANGULAR ELECTRON-BEAM
    OKUBO, T
    TAKAMOTO, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (08): : 1335 - 1341
  • [9] Fabrication of phase masks with sub-half micron resolution by electron beam lithography
    Di Fabrizio, E
    Grella, L
    Gentili, M
    Baciocchi, M
    Mastrogiacomo, L
    Vaninetti, F
    Fontana, F
    MICROELECTRONIC ENGINEERING, 1998, 42 : 121 - 124
  • [10] DIRECT ELECTRON-BEAM WRITING OF DEVICES AND CIRCUITS ON SILICON
    YAU, LD
    THIBAULT, LR
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 11 - 11