Noise characteristics of NbN nanobridge dc SQUIDs fabricated by field emission technique

被引：0

作者：

Nagaoka, Shiro ^{[1
]}

Irie, Akinobu ^{[1
]}

Hamasaki, Katsuyoshi ^{[1
]}

Yamashita, Tsutomu ^{[1
]}

机构：

[1] TOSOH Co, Ayase, Japan

来源：

Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi) | 1991年 / 74卷 / 05期

关键词：

Magnetic Field Measurement - Sensors;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

NbN nanobridge de SQUIDs were fabricated by the field evaporation method and their noise characteristics were evaluated. The fabricated device has a magnetic flux-voltage conversion efficiency &partV/&part$PHI of about 2.5 mV/$PHI0 and hence the device has a higher gain than that of the tunneling-type device with a resistive shunt. The energy resolution is as small as 40 h. When the fabricated SQUID was installed in an FLL circuit and the dynamic range was measured, it is found that an output is proportional to the input for the input magnetic flux of ±32$PHI0 without removing the lock. The magnetic flux resolution of the FLL circuit used is 9 × 10-10 $PHI02/Hz in the white noise region (at 3 kHz). In the low-frequency region less than 100 Hz, the 1/f noise described by 5.8 × 10-8 (1/f)$PHI02/Hz was observed. This value of the magnetic flux resolution is large by one order of magnitude than that inherent to the device and the noise of the electronics is predominant.

引用

页码：71 / 77