Distribution and impact of local trapped charges in silicon-oxide-nitride- oxide-silicon (SONOS) memory

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[1] Sun, Lei
[2] Pan, Liyang
[3] Zeng, Ying
[4] Pang, Huiqing
[5] Wang, Jimin
[6] Zhang, Zhaojian
[7] Li, Xiyou
[8] Zhu, Jun
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Sun, L. | 1600年 / Japan Society of Applied Physics卷 / 44期
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