A novel characterization of 2D edges based on wavelet transform
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作者:
Yang, L.
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机构:
Dept. of Sci. Comp. and Comp. Appl., Zhongshan University, Guangzhou 510275, ChinaDept. of Sci. Comp. and Comp. Appl., Zhongshan University, Guangzhou 510275, China
Yang, L.
[1
]
Liu, Y.
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机构:
Dept. of Sci. Comp. and Comp. Appl., Zhongshan University, Guangzhou 510275, ChinaDept. of Sci. Comp. and Comp. Appl., Zhongshan University, Guangzhou 510275, China
Liu, Y.
[1
]
Li, F.
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机构:
Dept. of Sci. Comp. and Comp. Appl., Zhongshan University, Guangzhou 510275, ChinaDept. of Sci. Comp. and Comp. Appl., Zhongshan University, Guangzhou 510275, China
Li, F.
[1
]
机构:
[1] Dept. of Sci. Comp. and Comp. Appl., Zhongshan University, Guangzhou 510275, China
来源:
Zhongshan Daxue Xuebao/Acta Scientiarum Natralium Universitatis Sunyatseni
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2001年
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40卷
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05期
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摘要:
The characterization of curves in an image with wavelet transform is studied. Two novel wavelets are utilized to characterize and detect curves. Some significant characteristics of the local maximum moduli of the wavelet transform with respect to curves are presented. At last, the characteristics are applied to design a new algorithm to detect curves in an image.