Surfactant influence on the Ge heteroepilayer on Si(0 0 1) studied by X-ray diffraction and atomic force microscopy

被引：0
|
作者：
Fundan Univ, Shanghai, China [1 ]
机构：
来源：
J Cryst Growth | / 1-2卷 / [d]115-119期
关键词：
Number:; -; Acronym:; NSFC; Sponsor: National Natural Science Foundation of China;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 8 条
  • [1] Ge/Si islands in a three-dimensional island crystal studied by x-ray diffraction
    Novák, J.
    Holý, V.
    Stangl, J.
    Fromherz, T.
    Zhong, Zhenyang
    Chen, Gang
    Bauer, G.
    Struth, B.
    Journal of Applied Physics, 2005, 98 (07):
  • [2] Radiation effects of 1.3 keV electron and 1.486 keV X-ray photon on trimethylsilane doped Si (1 0 0) surfaces
    Univ of Texas at El Paso, El Paso, United States
    Nucl Instrum Methods Phys Res Sect B, 1-4 (223-227):
  • [3] Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy
    Universita' di Lecce, Lecce, Italy
    Surface and Coatings Technology, 1998, 100-101 (1-3): : 76 - 79
  • [4] Pressure and temperature dependence of the Eu valence in EuNi2Ge2 and related systems studied by Moessbauer effect, X-ray absorption and X-ray diffraction
    Universitaet-GH Paderborn, Paderborn, Germany
    J Alloys Compd, 1-2 (220-231):
  • [5] Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity
    Univ of Liege, Liege, Belgium
    Thin Solid Films, 1-2 (148-155):
  • [6] Structure determination of the indium-induced Ge(103)-(1 × 1) reconstruction by surface X-ray diffraction
    Bunk, O.
    Falkenberg, G.
    Zeysing, J.H.
    Lottermoser, L.
    Johnson, R.L.
    Nielsen, M.
    Berg-Rasmussen, F.
    Feidenhans'L, R.
    Applied Surface Science, 1999, 142 (01): : 88 - 93
  • [7] The influence of the growth rate on the preferred orientation of magnetron-sputtered Ti-Al-N thin films studied by in situ x-ray diffraction
    Beckers, M.
    Schell, N.
    Martins, R.M.S.
    Mücklich, A.
    Möller, W.
    Journal of Applied Physics, 2005, 98 (04):
  • [8] Atomic force microscopy and x-ray photoelectron spectroscopy investigations of the morphology and chemistry of a PdCl2/SnCl2 electroless plating catalysis system adsorbed onto shape memory alloy particles
    Silvain, J.F. (silvain@icmb-bordeaux.cnrs.fr), 1600, American Institute of Physics Inc. (96):
1