Automated test generation and evaluation for real-time expert systems

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[1] Becker, Lee
[2] Duckworth, James
[3] Laznovsky, Aaron
[4] Green, Peter
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Becker, Lee | 1600年 / Publ by John Wiley & Sons Inc, New York, NY, United States卷 / 09期
关键词：
Expert systems;
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