Analysis of bipolar linear circuit response mechanisms for high and low dose rate total dose irradiations

被引：0
作者：
Mission Research Corp, Albuquerque, United States [1 ]
机构：
来源：
IEEE Trans Nucl Sci | / 6 Pt 1卷 / 3040-3048期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator
    Krieg, J
    Turflinger, T
    Titus, J
    Cole, P
    Baker, P
    Gehlhausen, M
    Emily, D
    Yang, L
    Pease, RL
    Barnaby, H
    Schrimpf, R
    Maher, MC
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1999, 46 (06) : 1627 - 1632
  • [42] Single Event Effects and Total Dose Performance at High and Low Dose Rate of a Switching Regulator
    Yang, Z-W
    Hiemstra, D. M.
    Shi, S.
    Chen, L.
    2021 IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) / 2021 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2021, : 74 - 77
  • [43] Thermoluminescent response of silica beads to high-dose irradiations
    Ley, K.
    Hashim, S. A.
    Lohstroh, A.
    Shenton-Taylor, C.
    Bradley, D. A.
    RADIATION PHYSICS AND CHEMISTRY, 2020, 167 (167)
  • [44] KINETICS OF REPAIR - ITS INFLUENCE IN LOW-DOSE RATE IRRADIATIONS
    SCALLIET, P
    LANDUYT, W
    VANDERSCHUEREN, E
    RADIOTHERAPY AND ONCOLOGY, 1988, 11 (03) : 249 - 251
  • [45] Dose rate and total dose rate 1/f noise performance of GaAs heterojunction bipolar transistors
    Hiemstra, David M.
    IEEE Transactions on Nuclear Science, 1996, 43 (6 Pt 1) : 3076 - 3080
  • [46] Low dose rate effects on linear bipolar IC's: Experiments on the time dependence
    Freitag, RK
    Brown, DB
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 1906 - 1913
  • [47] Study of low-dose-rate radiation effects on commercial linear bipolar ICs
    Freitag, RK
    Brown, DB
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2649 - 2658
  • [48] The Effects of Hydrogen on the Enhanced Low Dose Rate Sensitivity (ELDRS) of Bipolar Linear Circuits
    Pease, Ronald L.
    Adell, Philippe Claude
    Rax, Bernard G.
    Chen, Xiao Jie
    Barnaby, Hugh J.
    Holbert, Keith E.
    Hjalmarson, Harold P.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (06) : 3169 - 3173
  • [49] Annealing behavior of linear bipolar devices with enhanced low-dose-rate sensitivity
    Shaneyfelt, MR
    Schwank, JR
    Fleetwood, DM
    Pease, RL
    Felix, JA
    Dodd, PE
    Maher, MC
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (06) : 3172 - 3177
  • [50] Impact of total ionizing dose on the analog single event transient sensitivity of a linear bipolar integrated circuit
    Bernard, M. F.
    Dusseau, L.
    Buchner, S.
    McMorrow, D.
    Ecoffet, R.
    Boch, J.
    Vaille, J. -R.
    Schrimpf, R. D.
    LaBel, K.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) : 2534 - 2540
12345