Analysis of bipolar linear circuit response mechanisms for high and low dose rate total dose irradiations

被引:0
|
作者
Mission Research Corp, Albuquerque, United States [1 ]
机构
来源
IEEE Trans Nucl Sci | / 6 Pt 1卷 / 3040-3048期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Analysis of bipolar linear circuit response mechanisms for high and low dose rate total dose irradiations
    Barnaby, H
    Tausch, HJ
    Turfler, R
    Cole, P
    Baker, P
    Pease, RL
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (06) : 3040 - 3048
  • [2] Enhanced damage in bipolar linear integrated circuits at low dose rate irradiations
    Chen, Panxun
    Hedianzixue Yu Tance Jishu/Nuclear Electronics & Detection Technology, 1999, 19 (05): : 333 - 337
  • [3] Hydrogen Limits for Total Dose and Dose Rate Response in Linear Bipolar Circuits
    Adell, Philippe. C.
    Rax, Bernard
    Esqueda, Ivan S.
    Barnaby, Hugh. J.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (06) : 2476 - 2481
  • [4] DEPENDENCE OF TOTAL-DOSE RESPONSE OF BIPOLAR LINEAR MICROCIRCUITS ON APPLIED DOSE-RATE
    MCCLURE, S
    PEASE, RL
    WILL, W
    PERRY, G
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 2544 - 2549
  • [5] Total Dose Performance at High and Low Dose Rate of biCMOS and Bipolar Voltage References
    Hiemstra, D. M.
    Li, X-T
    Chen, L.
    Kirischian, V
    2018 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2018, : 173 - 175
  • [6] The effects of hydrogen in hermetically sealed packages on the total dose and dose rate response of bipolar linear circuits
    Pease, Ronald L.
    Platteter, Dale G.
    Dunham, Gary W.
    Seiler, John E.
    Adell, Philippe C.
    Barnaby, Hugh J.
    Chen, Jie
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) : 2168 - 2173
  • [7] Effect of switching from high to low dose rate on linear bipolar technology radiation response
    Boch, J
    Saigné, F
    Schrimpf, RD
    Fleetwood, DM
    Ducret, S
    Dusseau, L
    David, JP
    Fesquet, J
    Gasiot, J
    Ecoffet, R
    PROCEEDINGS OF THE 7TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, 2004, 536 : 537 - 543
  • [8] Effect of switching from high to low dose rate on linear bipolar technology radiation response
    Boch, J
    Saigné, F
    Schrimpf, RD
    Fleetwood, DM
    Ducret, S
    Dusseau, L
    David, JP
    Fesquet, J
    Gasiot, J
    Ecoffet, R
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (05) : 2896 - 2902
  • [9] Total Dose Performance at High and Low Dose Rate of CMOS, biCMOS, and Bipolar Low Dropout Voltage Regulators
    Hiemstra, D. M.
    Li, X. -T.
    Chen, L.
    Kirischian, V.
    2019 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2019, : 8 - 10
  • [10] Total Ionizing Dose Effects in MOS and Low-Dose-Rate-Sensitive Linear-Bipolar Devices
    Fleetwood, Daniel M.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2013, 60 (03) : 1706 - 1730