Metal-dependent Schottky barrier height with the (NH4)2Sx-treated GaAs

被引:0
|
作者
Fan, Jia-Fa [1 ]
Oigawa, Haruhiro [1 ]
Nannichi, Yasuo [1 ]
机构
[1] Univ of Tsukuba, Japan
来源
| 1600年 / 27期
关键词
Interface State Density Reduction - Schottky Barrier Height - Surface Treatment - Work Function;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Low-temperature epitaxial growth of CaF2 on (NH4)2Sx-treated GaAs(100) surface
    Shoji, Daisei
    Niwano, Michio
    Miyamoto, Nobuo
    Applied Surface Science, 1997, 117-118 : 443 - 446
  • [22] High-Quality SiO2 Grown on (NH4)2Sx-Treated GaAs by Liquid Phase Deposition
    Lee, Ming-Kwei
    Yen, Chih-Feng
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (05) : 3590 - 3593
  • [23] Thin TiO2 grown by metal–organic chemical vapor deposition on (NH4)2Sx-treated InP
    Ming-Kwei Lee
    Chih-Feng Yen
    Shih-Chen Chiu
    Applied Physics A, 2011, 104 : 1175 - 1180
  • [24] X-RAY STANDING-WAVE ANALYSIS OF THE (NH4)2SX-TREATED GAAS(111)B SURFACE
    MAEYAMA, S
    SUGIYAMA, M
    OSHIMA, M
    SUGAHARA, H
    OIGAWA, H
    NANNICHI, Y
    HASHIZUME, H
    APPLIED SURFACE SCIENCE, 1992, 60-1 : 513 - 516
  • [25] GROWTH AND CHARACTERIZATION OF ZNSE ON (NH4)2SX-TREATED GAAS SUBSTRATES - EFFECT OF GAAS SURFACE MICROSTRUCTURE ON THE GROWTH-RATE OF ZNSE
    WU, YH
    KAWAKAMI, Y
    FUJITA, S
    FUJITA, S
    JOURNAL OF CRYSTAL GROWTH, 1991, 111 (1-4) : 757 - 761
  • [26] (NH4)2Sx-Treated AlGaN MIS Photodetectors with LPD SiO2 Layer
    Lan, C. H.
    Hwang, J. D.
    Chang, S. J.
    Cheng, Y. C.
    Lin, W. J.
    Lin, J. C.
    Liao, J. S.
    Lin, Y. L.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 157 (06) : H613 - H616
  • [27] (NH4)2Sx-treated GaAs(001), (111)A, and (111)B surfaces studied by x-ray photoelectron spectroscopy
    Fukuda, Y
    Suzuki, Y
    Sanada, N
    Ohsawa, T
    Sasaki, S
    ECASIA 97: 7TH EUROPEAN CONFERENCE ON APPLICATIONS OF SURFACE AND INTERFACE ANALYSIS, 1997, : 487 - 490
  • [28] Electrical improvement of fluorine-passivated metal-organic chemical vapor deposited TiO2 film on (NH4)2Sx-treated GaAs
    Lee, Ming-Kwei
    Yen, Chih-Feng
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2007, 46 (45-49): : L1173 - L1175
  • [29] (NH4)2Sx-Treated AlGaN/GaN MOS-HEMTs with ZnO Gate Dielectric Layer
    Chiou, Ya-Lan
    Lee, Ching-Ting
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2011, 158 (02) : H156 - H159
  • [30] Surface analysis of (NH4)2Sx-treated InGaN using x-ray photoelectron spectroscopy
    Lin, YJ
    Lee, CT
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (05): : 1734 - 1738