Effect of a charged scanned probe microscope tip on a subsurface electron gas

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Harvard Univ, Cambridge, United States [1 ]
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Superlattices Microstruct | / 4卷 / 435-440期
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Acknowledgements—The authors thank J. P. Wolfe and Kent McCormick for useful discussions. This work was funded at Harvard by ONR N00014-95-1-0104; !text type='JS']JS[!/text]EP N00014-89-J-1023; NSF DMR-95-01438 and the MRSEC program of the National Science Foundation under DMR-94-00396; and at UCSB by AFOSR grant F49620-94-1-0158;
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