共 50 条
- [42] AN ULTRAHIGH-VACUUM ANALYTICAL ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1981, 30 (03): : 231 - 231
- [43] ULTRAHIGH-VACUUM SCANNING ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 298 - 298
- [44] EFFECT OF SUBSTRATE-TEMPERATURE ON ULTRAHIGH-VACUUM INTERFACES OF INDIUM OXIDE GAAS(110) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (03): : 567 - 571
- [45] A NEW ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE DESIGN FOR SURFACE SCIENCE STUDIES REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (10): : 3113 - 3118
- [46] OBSERVATION OF 7X7 RECONSTRUCTED STRUCTURE ON THE SILICON (111) SURFACE USING ULTRAHIGH-VACUUM NONCONTACT ATOMIC-FORCE MICROSCOPY JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (1B): : L145 - L148
- [47] Development of low temperature ultrahigh vacuum atomic force microscope/scanning tunneling microscope Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (6 B): : 3750 - 3752
- [48] Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1289 - 1295
- [49] Development of low temperature ultrahigh vacuum atomic force microscope/scanning tunneling microscope JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B): : 3750 - 3752
- [50] Scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (01): : 221 - 225