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- [11] VARIABLE-TEMPERATURE ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (11): : 5266 - 5271
- [12] Observation of hydrogen-terminated silicon(111) surface by ultrahigh-vacuum atomic force microscopy Japanese Journal of Applied Physics, Part 2: Letters, 1993, 32 (9 B):
- [13] DEVELOPMENT OF AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE FOR INVESTIGATIONS OF SEMICONDUCTOR SURFACES JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (06): : 1987 - 1991
- [14] ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE USING A PANTOGRAPH INCHWORM MECHANISM REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (12): : 3524 - 3529
- [15] A LOW-TEMPERATURE ATOMIC FORCE SCANNING TUNNELING MICROSCOPE FOR ULTRAHIGH-VACUUM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 984 - 988
- [16] Atomically resolved InP(110) surface observed with noncontact ultrahigh vacuum atomic force microscope Japanese Journal of Applied Physics, Part 2: Letters, 1995, 34 (8 B):
- [17] ATOMIC-FORCE MICROSCOPY IN ULTRAHIGH-VACUUM JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3726 - 3734
- [18] Contrast of atomic-resolution images from a noncontact ultrahigh-vacuum atomic force microscope JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1995, 34 (12B): : L1692 - L1694
- [19] Observation of silicon surfaces using ultrahigh-vacuum noncontact, atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1996, 35 (5B): : L668 - L671
- [20] Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 953 - 956