Photothermal measurements on optical thin films

被引:0
|
作者
Welsch, E. [1 ]
Ristau, D. [2 ]
机构
[1] Physikalisch-Astronomisch-Technikwissenschaftliche Fakultät, Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany
[2] Laserkomponenten, Laser-Zentrum Hannover e.V., Hollerithallee 8, 30419 Hannover, Germany
来源
Applied Optics | 1995年 / 34卷 / 31期
关键词
Compendex;
D O I
暂无
中图分类号
学科分类号
摘要
Thin films
引用
收藏
页码:7239 / 7253
相关论文
共 50 条
  • [41] Optical absorption spectra of perovskite thin films for defect estimation by photothermal bending spectroscopy
    Hirota, Yuta
    Kato, Hiroki
    Kawahara, Kouki
    Yoshida, Norimitsu
    Nonomura, Shuichi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (08)
  • [42] SURFACE-ABSORPTION MEASUREMENTS OF THIN-FILMS BY CAVITY-ENHANCED PHOTOTHERMAL SPECTROSCOPY
    SCHUESSLER, HA
    CHEN, SH
    RONG, Z
    TANG, ZC
    OPTICS LETTERS, 1991, 16 (08) : 608 - 610
  • [43] Modeling for thermal conductivity measurements of thin films using photothermal deflection with obliquely crossed configuration
    Li, BC
    Zhang, SY
    APPLIED PHYSICS B-LASERS AND OPTICS, 1997, 65 (03): : 403 - 409
  • [44] Modeling for thermal conductivity measurements of thin films using photothermal deflection with obliquely crossed configuration
    B.-C. Li
    S.-Y. Zhang
    Applied Physics B, 1997, 65 : 403 - 409
  • [45] ESR and magneto-optical measurements in EuTe films and thin films of EuTe/Fe
    Hori, H
    Furusawa, M
    Akimoto, R
    Kobayashi, M
    Kakeya, I
    Kindo, K
    PHYSICA B, 1996, 216 (3-4): : 347 - 350
  • [46] Monitoring the formation of thin films by photothermal technique
    Martinez-Torres, P.
    Jose Alvarado-Gil, Juan
    INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2007, 28 (03) : 996 - 1003
  • [47] Photothermal deflection spectroscopy of polymer thin films
    So, S.K.
    Chan, M.H.
    Leung, L.M.
    Applied Physics A: Materials Science and Processing, 1995, 61 (02): : 159 - 161
  • [48] PYROELECTRIC PHOTOTHERMAL SPECTROSCOPY FOR THIN SOLID FILMS
    TANAKA, K
    ICHIMURA, Y
    SINDOH, K
    JOURNAL OF APPLIED PHYSICS, 1988, 63 (06) : 1815 - 1819
  • [49] Monitoring the Formation of Thin Films by Photothermal Technique
    P. Martinez-Torres
    Juan José Alvarado-Gil
    International Journal of Thermophysics, 2007, 28 : 996 - 1003
  • [50] Using the optical parametrical oscillator for spectroscopical measurements of composite thin films
    Milovzorov, D
    Suzuki, T
    ANALYTICAL AND DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS, DEVICES, AND PROCESSES, 1999, 99 (16): : 464 - 471