ASYNCHRONOUS INTERFACE TESTER.

被引:0
作者
Bogholtz, R.
Bosch, L.
Kazmierczak, G.
Mezzacappa Jr., V.
Perini, G.
机构
来源
IBM technical disclosure bulletin | 1984年 / 27卷 / 4 B期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:2450 / 2451
相关论文
共 50 条
[21]   LIQUID CRYSTAL ELECTRICAL CONTINUITY TESTER. [J].
Kumar, A.H. ;
Murty, K. .
IBM technical disclosure bulletin, 1983, 26 (05) :2594-2595
[22]   SULTAN MICROPROCESSOR CONTROLLED ROBOT TESTER. [J].
Chrisfield, Robin W. .
Telecommunication Journal of Australia, 1985, 35 (01) :67-72
[23]   SYSTEM APPROACH TO THE DESIGN OF VLSI TESTER. [J].
Fazil, M.M. .
CSIO Communications (Central Scientific Instruments Organization), 1985, 12 (2-4) :102-110
[24]   DEVELOPMENT OF A PORTABLE ULTRASONIC HARDNESS TESTER. [J].
Bagchi, S.N. ;
Kataria, M.R. .
CSIO Communications (Central Scientific Instruments Organization), 1980, 7 (04) :62-65
[25]   AUTOMATIC NICKEL CADMIUM BATTERY TESTER. [J].
Waters, T.W. .
Electronic Engineering (London), 1978, 50 (601)
[26]   AUTOMATED LOGIC GATE ASSEMBLY TESTER. [J].
Anon .
IBM technical disclosure bulletin, 1986, 29 (04) :1758-1759
[27]   PLATED-MEMORY-WIRE TESTER. [J].
Kitano, Yoshitaka ;
Yamagata, Mitsuharu .
Review of the Electrical Communication Laboratories (Tokyo), 1973, 21 (5-6) :332-338
[28]   LOCKHEED-GEORGIA ULTRASONIC TESTER. [J].
Anon .
Aircraft Engineering and Aerospace Technology, 1984, 56 (02)
[29]   Use of a Roller Machine as a Plasticity Tester. [J].
Hennikce, Hans Walter ;
Segere, Hans .
CFI Ceramic Forum International, 1985, 62 (01) :15-20
[30]   PROGRAMMABLE ARRAY ADAPTER FOR TRANSISTOR TESTER. [J].
Sutcliffe, A.J. ;
Waldow, L.F. .
IBM technical disclosure bulletin, 1983, 25 (12) :6705-6706