High temperature annealing of GaxAl(1-x)As:C leads to a reduction in both lattice strain and hole concentration which have been attributed to the creation of a number of defects including Ci. The structure and dynamic properties of two C interstitials as well as acceptor pairs are analyzed using first principles local density functional cluster theory. We find that Ci-CAs defects have properties in common with those formed by high temperature annealing.