Observation of Si(110) surfaces by high-temperature scanning tunneling microscopy

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Yoshimura, Masamichi [1 ]
An, Toshu [1 ]
Ueda, Kazuyuki [1 ]
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[1] Toyota Technological Institute, 2-12-1 Hisakata, Tempaku-ku, Nagoya 468-8511, Japan
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| 1600年 / JJAP, Tokyo, Japan卷 / 39期
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