Domain contrast and polarization reversal of TGS crystals by scanning electron microscopy in EBIC mode

被引:0
|
作者
Sogr, A.A. [1 ]
Kopylova, I.B. [1 ]
机构
[1] Polytechnical Inst, Blagoveshchensk, Russia
关键词
701.1 Electricity: Basic Concepts and Phenomena - 708.1 Dielectric Materials - 801 Chemistry - 932.1 High Energy Physics - 933.1.1 Crystal Lattice;
D O I
暂无
中图分类号
学科分类号
摘要
4
引用
收藏
页码:217 / 220
相关论文
共 50 条
  • [21] EBIC imaging using scanning transmission electron microscopy: experiment and analysis
    Shigeyasu Tanaka
    Hiroki Tanaka
    Tadahiro Kawasaki
    Mikio Ichihashi
    Takayoshi Tanji
    Koji Arafune
    Yoshio Ohshita
    Masafumi Yamaguchi
    Journal of Materials Science: Materials in Electronics, 2008, 19 : 324 - 327
  • [22] EBIC imaging using scanning transmission electron microscopy: experiment and analysis
    Tanaka, Shigeyasu
    Tanaka, Hiroki
    Kawasaki, Tadahiro
    Ichihashi, Mikio
    Tanji, Takayoshi
    Arafune, Koji
    Ohshita, Yoshio
    Yamaguchi, Masafumi
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2008, 19 (Suppl 1) : S324 - S327
  • [23] ELECTRON-BEAM INDUCED CONTRAST REVERSAL IN EBIC IMAGES OF DEFECTS IN CDS
    BELLO, B
    PASEMANN, L
    VALDRE, U
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 71 - 72
  • [24] ELECTRON-BEAM INDUCED CONTRAST REVERSAL IN EBIC IMAGES OF DEFECTS IN CDS
    BELLO, B
    PASEMANN, L
    VALDRE, U
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 71 - 72
  • [25] EBIC SCANNING ELECTRON-MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY OF SILICON GRAIN-BOUNDARIES
    MAURICE, JL
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1988, 13 (03): : A31 - A31
  • [28] SCANNING MODE IN ELECTRON-MICROSCOPY
    PFEFFERKORN, G
    MIKROSKOPIE, 1978, 34 (3-4) : 80 - 112
  • [29] DIRECT STUDY OF THE SLOW POLARIZATION REVERSAL PROCESS IN TGS BY MEANS OF LIQUID-CRYSTALS
    MATYJASEK, K
    STANKOWSKA, J
    FERROELECTRICS, 1989, 98 : 87 - 93
  • [30] LINEAR IMAGING IN SCANNING POLARIZATION INTERFERENCE CONTRAST MICROSCOPY
    SEE, CW
    IRAVANI, MV
    ELECTRONICS LETTERS, 1986, 22 (20) : 1079 - 1081