Local auger effects at point defects in silicon

被引：0
|
作者：
Grimmeiss, H.G. [1 ]
Kleverman, M. [1 ]
机构：
[1] Univ of Lund, Sweden
来源：
Journal of Physics and Chemistry of Solids | 1988年 / 49卷 / 06期
关键词：
Charge States - Local Auger Effects - Point Defects;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
页码：615 / 626
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