Live X-ray topography and crystal growth of silicon

被引：0

作者：

Chikawa, Jun-Ichi ^{[1
]}

机构：

[1] Center for Advanced Science and Technology, Kamigori, Ako, Hyogo, 678-1205, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 08期

关键词：

Crystal defects - Crystal growth - Crystals - Dislocations (crystals) - Optical resolving power - Phase equilibria - Phase interfaces - Photoconductivity - Surface topography - Synchrotron radiation - Video cameras - X ray analysis;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：4619 / 4631