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REPRODUCIBILITY OF ELECTROMIGRATION MEASUREMENTS.
被引:0
|
作者
:
Schafft, Harry A.
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
Schafft, Harry A.
[
1
]
Staton, Tammy C.
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
Staton, Tammy C.
[
1
]
Mandel, John
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
Mandel, John
[
1
]
Shott, John D.
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
Shott, John D.
[
1
]
机构
:
[1]
NBS, Gaithersburg, MD, USA, NBS, Gaithersburg, MD, USA
来源
:
|
1600年
/ ED-34期
关键词
:
CURRENT-DENSITY STRESS - ELECTROMIGRATION MEASUREMENTS REPRODUCIBILITY - MEDIAN-TIME-TO-FAILURE MEASUREMENTS - TEST EQUIVALENT SAMPLES;
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