Quantification of interfacial segregation by analytical electron microscopy

被引：0
作者：
Müllejans, Harald [1 ]
机构：
[1] Renewable energies, Inst. for Environ. and Sustainabil., European Commission - DG JRC, Ispra
来源：
Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques | 2003年 / 94卷 / 03期
关键词：
Analytical; Dedicated scanning transmission electron microscopy; Electron microscopy; Interfacial segregation; Quantification; Spatial difference;
D O I：
10.3139/146.030298
中图分类号：
学科分类号：
摘要：
The quantification of interfacial segregation by spatial difference and one-dimensional profiling is presented in general where special attention is given to the random and systematic uncertainties. The method is demonstrated for an example of Al-Al2O3 interfaces in a metal-ceramic composite material investigated by energy-dispersive X-ray spectroscopy and electron energy loss spectroscopy in a dedicated scanning transmission electron microscope. The variation of segregation measured at different interfaces by both methods is within the uncertainties, indicating a constant segregation level and interfacial phase formation. The most important random uncertainty is the counting statistics of the impurity signal whereas the specimen thickness introduces systematic uncertainties (via k factor and effective scan width). The latter could be significantly reduced when the specimen thickness is determined explicitly.
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页码：298 / 306
页数：8
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