Structural characteristics of combination oxide consisting of dry thermal SiO2 and sputtered SiO2

被引：0
|
作者：
Bhan, Rajinder Kumar [1 ]
Ashokan, Renganathan [1 ]
Mathur, Parmatma Chandra [1 ]
机构：
[1] Solid State Physics Lab, Delhi, India
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1994年 / 33卷 / 5 A期
关键词：
Combination oxides - Fourier transform infrared spectroscopy - Thermal silica;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：2708 / 2711
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