Extraction of inner layer from multiwall carbon nanotubes for scanning probe microscope tip
被引:0
作者:
机构:
[1] Akita, S.
[2] Nakayama, Y.
来源:
Akita, S. (akita@dd.pe.osakafu-u.ac.jp)
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2002年
/
The Japan Society of Applied Physics卷
/
Institute of Electrical and Electronics Engineers Inc., United States期
关键词:
761 Nanotechnology - 802.3 Chemical Operations - 819.4 Fiber Products - 933.1 Crystalline Solids and Crystallography;