New method for soft-error mapping in dynamic random access memory using nuclear microprobe

被引：0
|
作者：
Sayama, Hirokazu [1 ]
Hara, Shigenori [1 ]
Kimura, Hiroshi [1 ]
Ohno, Yoshikazu [1 ]
Satoh, Shinichi [1 ]
Takai, Mikio [1 ]
机构：
[1] Osaka Univ, Osaka, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 12 B期
关键词：
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页码：4541 / 4544
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