On-wafer heating tests to study stability of silicon devices

被引：0
|
作者：
Manic, D. [1 ]
Haddab, Y. [1 ]
Popovic, R.S. [1 ]
机构：
[1] Swiss Federal Inst of Technology, Lausanne, Switzerland
来源：
Microelectronics Reliability | 1998年 / 38卷 / 6-8期
关键词：
Number:; -; Acronym:; SNSF; Sponsor: Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung;
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摘要：
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页码：1069 / 1073
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