Mixed-signal testing embodies different kind of challenge

被引:0
|
作者
Artest [1 ]
机构
来源
EE Eval Engin | / 11卷 / 5 pp期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Mixed-signal testing embodies different kind of challenge
    Ganapol, D
    Imai, K
    EE-EVALUATION ENGINEERING, 1999, 38 (11): : 133 - +
  • [2] MIXED-SIGNAL DEVICES PRESENT TESTING CHALLENGE
    NOVELLINO, J
    ELECTRONIC DESIGN, 1990, 38 (13) : 53 - &
  • [3] MIXED-SIGNAL TESTING
    LOWE, L
    EE-EVALUATION ENGINEERING, 1994, 33 (07): : 12 - 12
  • [4] Testing mixed-signal cores
    Huertas, G
    Vazquez, D
    Peralías, E
    Rueda, A
    Huertas, JL
    13TH SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN, PROCEEDINGS, 2000, : 307 - 312
  • [5] TESTING MIXED-SIGNAL DEVICES
    KRAMER, R
    IEEE DESIGN & TEST OF COMPUTERS, 1987, 4 (02): : 12 - 20
  • [6] Testing in a mixed-signal world
    Agrawal, VD
    NINTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE AND EXHIBIT, PROCEEDINGS, 1996, : 241 - 244
  • [7] Faster mixed-signal testing
    不详
    IEEE DESIGN & TEST OF COMPUTERS, 1999, 16 (03): : 10 - 10
  • [8] IEEE Mixed-Signal Testing Workshop
    Kaminska, B
    IEEE DESIGN & TEST OF COMPUTERS, 1996, 13 (03): : 114 - 114
  • [9] TESTING CHALLENGES FOR MIXED-SIGNAL ICS
    JACOB, G
    EE-EVALUATION ENGINEERING, 1994, 33 (05): : 154 - 155
  • [10] Pseudorandom testing for mixed-signal circuits
    Pan, CY
    Cheng, KT
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1997, 16 (10) : 1173 - 1185