Determination of Surface State Densities from Measurements of MOS Transistors in the Wear Inversion Region.

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作者：

Pasztor, G.

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来源：

Acta Technica (Budapest) | 1975年 / 80卷 / 1-2期

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Compendex;

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摘要：

SEMICONDUCTOR DEVICES, FIELD EFFECT

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页码：237 / 250

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