Spatial coherency of the synchrotron radiation at the visible light region and its application for the electron beam profile measurement

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作者：

High Energy Accelerator Research, Organization, Ibaraki, Japan ^{[1
]}

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来源：

Proc IEEE Part Accel Conf | / 766-768期

关键词：

Citterut-Zernike's theorem - Electron beam profile measurement;

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摘要：

A spatial coherencies of SR beam at visible light region were measured both σ and π-polarized components at Photon Factory. A wave-front division type polarized interferometer was designed and constructed for this experiment. Interferograms were observed clearly in the vertical direction. π phase difference of the interference fringe was observed between interferograms corresponding to σ and π-polarized components. Degree of spatial coherence was measured and by means of the van Citterut-Zernike's theorem, a vertical beam profile was obtained by the Fourier transform of the degree of spatial coherence.

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