FAULT LOCALISATION WHEN TESTING COMPLEX CIRCUITS.

被引：0
作者：
Velazco, R. [1 ]
机构：
[1] CNRS, Lab Circuits et Systemes, St., -Martin d'Heres, Fr, CNRS, Lab Circuits et Systemes, St. -Martin d'Heres, Fr
来源：
IEE proceedings. Part G. Electronic circuits and systems | 1985年 / 132卷 / 05期
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摘要：
An approach to state functional diagnosis when testing complex integrated circuits is presented. Such an approach can lead in some cases to low-level fault localization. Experiments using the capabilities of a realized test system (GAPT test program generator, specific tester), illustrating the efficiency of this approach, are presented.
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页码：241 / 245
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