FAULT LOCALISATION WHEN TESTING COMPLEX CIRCUITS.

被引：0

作者：

Velazco, R. ^{[1
]}

机构：

[1] CNRS, Lab Circuits et Systemes, St., -Martin d'Heres, Fr, CNRS, Lab Circuits et Systemes, St. -Martin d'Heres, Fr

来源：

IEE proceedings. Part G. Electronic circuits and systems | 1985年 / 132卷 / 05期

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摘要：

An approach to state functional diagnosis when testing complex integrated circuits is presented. Such an approach can lead in some cases to low-level fault localization. Experiments using the capabilities of a realized test system (GAPT test program generator, specific tester), illustrating the efficiency of this approach, are presented.

引用

页码：241 / 245

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