TEM study of twist boundaries and colony boundaries in (Bi, Pb)2Sr2Ca2Cu3Ox silver-sheathed tapes

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ETH Zurich, Zurich, Switzerland ^{[1
]}

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来源：

Phys C Supercond | / 1-2卷 / 155-163期

关键词：

Bismuth compounds - Electric currents - Grain boundaries - High temperature superconductors - Lead compounds - Tapes - Transmission electron microscopy;

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摘要：

The grain boundaries in high-jc (Bi, Pb)2Sr2Ca2Cu3Ox silver-sheathed tapes have been investigated using transmission electron microscopy. The typical microstructural feature in these tapes are the colonies, which consist of grains with a common c-axis. The grains within a colony are piled up along the common c-axis and are separated by [001] twist boundaries. It was found that the rotation angle of these twist boundaries takes several definite values. Colony boundaries are formed between colonies having slightly tilted c-axes with respect to each other and are virtually free from amorphous material and intergranular phases. Two basic types of colony boundaries have been observed: the small-angle c-axis tilt boundary and the edge-on c-axis tilt boundary. The weak bonds between the BiO double layers are responsible for the mica-like crystalline structure of Bi2Sr2Can-1CunOx and their importance concerning the formation of colony boundaries is discussed.

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