New, optical-lever based atomic force microscope

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作者：
机构：
[1] Hansma, P.K.
[2] Drake, B.
[3] Grigg, D.
[4] Prater, C.B.
[5] Yashar, F.
[6] Gurley, G.
[7] Elings, V.
[8] Feinstein, S.
[9] Lal, R.
来源：
Hansma, P.K. | 1600年 / American Inst of Physics, Woodbury, NY, United States卷 / 76期
关键词：
Cells - Focusing - Laser beams - Lenses - Optical collimators - Photodiodes - Piezoelectric devices - Reflection - Scanning - Semiconducting silicon - Semiconductor lasers - Tracking (position);
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摘要：
The novel Atomic Force Microscope (AFM) is presented in this paper. It has the capability to image large samples such as live cells in Petri dishes or intact silicon wafers. It can also operate at nanoNewton forces over scan areas of order 100 μm because the cantilever is tracked with a scanning focused spot. It possesses an open arrangement that enables it to be integrated with other instruments such as optical microscope with high numerical aperture as utilized for the cell images presented in this study. An AFM is under development to be combined with a scanning electron microscope for in-situ, electron-beam-deposited tip fabrication.
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