Speciation of aluminium in silicon carbide by electrothermal vaporization-inductively coupled plasma atomic emission spectrometry

被引：0

作者：

Hassler, Jürgen ^{[1
]}

Záray, Gyula ^{[2
,3
]}

Schwetz, Karl ^{[1
]}

Flórián, Karol ^{[4
]}

机构：

[1] ESK Ceramics GmbH and Co, KG, Max Schaidhauf 25, D-87437 Kempten, Germany

[2] Department of Inorganic and Analytical Chemistry, Eötvös University, P.O. Box 32, H-1518, Budapest, Hungary

[3] Joint Research Group of Environmental Chemistry, Hungarian Academy of Sciences, Eötvös University, P. O. Box 32, H-1518, Budapest, Hungary

[4] Department of Chemistry, Technical University of Košice, Letna 9, 04200 Košice, Slovakia

来源：

Journal of Analytical Atomic Spectrometry | 2005年 / 20卷 / 09期

关键词：

931.3 Atomic and Molecular Physics - 804.2 Inorganic Compounds - 803 Chemical Agents and Basic Industrial Chemicals - 932.3 Plasma Physics - 802.3 Chemical Operations - 541.1 Aluminum - 533.1 Ore Treatment - 741.1 Light/Optics;

D O I：

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学科分类号：

摘要：

An electrothermal vaporization-inductively coupled plasma atomic emission spectrometric (ETV-ICP-AES) method was developed for rapid determination of binder and lattice phase aluminium in liquid-phase sintered silicon carbide (LPS-SiC) materials. By means of thermal fractionation the binder and the lattice phase aluminium were evaporated from the solid sample in temperature ranges of 1250-2000 and 2000-2450°C, respectively. Due to the decomposition of silicon carbide matrix above 2000°C, and the vaporization of silicon, a strong matrix effect was observed which resulted in different sensitivities for determination of the binder and the lattice phase aluminium. Therefore the calibration needed two calibration curves determined by home-made solid standard materials in the above mentioned temperature ranges. Using this method aluminium can be measured in concentration range of 0.1-2.0% in two different phases within 90 min. The time demand of the conventional wet chemical method amounts to 16 h. The analytical data determined by the ETV-ICP-AES method deviate from the wet chemical results maximum by -13 and +20%, which is acceptable for the technological control of the LPS-SiC production. © The Royal Society of Chemistry 2005.

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页码：954 / 956