Self-heating effect in SOI MOSFET's

被引：0
|
作者：
Tsinghua Univ, Beijing, China [1 ]
机构：
来源：
International Conference on Solid-State and Integrated Circuit Technology Proceedings | 1998年
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：572 / 574
相关论文
共 50 条
  • [41] The self-heating effect on SOI LIGBTs under the steady-state condition
    Koo, YD
    Kwon, OK
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1999, 34 : S339 - S342
  • [42] Analysis of Self-heating Effect in a SOI LDMOS Device under an ESD Stress
    Li, Tianxing
    Cao, Jian
    Zhang, Lizhong
    Wang, Yuan
    2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2016, : 459 - 461
  • [43] The heat dissipation path of self-heating effects for the SOI MOSFET by considering the BOX layer and the TiN barrier layer
    Li, Y. F.
    Xu, L. D.
    Ni, T.
    Wang, J. J.
    Gao, L. C.
    Li, D. L.
    Wang, J. J.
    Ma, Q. G.
    Wang, Z. J.
    Zeng, C. B.
    Li, B.
    Luo, J. J.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2024, 57 (17)
  • [44] An analytical fully-depleted SOI MOSFET model considering the effects of self-heating and source/drain resistance
    Hu, MC
    Jang, SL
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (04) : 797 - 801
  • [45] Double step buried oxide (DSBO) SOI-MOSFET: A proposed structure for improving self-heating effects
    Orouji, Ali A.
    Heydari, Sara
    Fathipour, Morteza
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2009, 41 (09): : 1665 - 1668
  • [46] Spatial temperature profiles due to nonuniform self-heating in LDMOS's in thin SOI
    Leung, YK
    Kuehne, SC
    Huang, VSK
    Nguyen, CT
    Paul, AK
    Plummer, JD
    Wong, SS
    IEEE ELECTRON DEVICE LETTERS, 1997, 18 (01) : 13 - 15
  • [47] A new structure design of a silicon-on-insulator MOSFET reducing the self-heating effect
    Awadallah, R
    Yuan, JS
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1999, 86 (06) : 707 - 712
  • [48] Simulation of self-heating effects in different SOI MOS architectures
    Braccioli, M.
    Curatola, G.
    Yang, Y.
    Sangiorgi, E.
    Fiegna, C.
    SOLID-STATE ELECTRONICS, 2009, 53 (04) : 445 - 451
  • [49] SCALING CONSTRAINTS IMPOSED BY SELF-HEATING IN SUBMICRON SOI MOSFETS
    DALLMANN, DA
    SHENAI, K
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1995, 42 (03) : 489 - 496
  • [50] Measurement and simulation of self-heating in SOI CMOS analogue circuits
    Tenbroek, BM
    Lee, MSL
    Redman-White, W
    Edwards, CF
    Bunyan, RJT
    Uren, MJ
    1997 IEEE INTERNATIONAL SOI CONFERENCE PROCEEDINGS, 1996, : 156 - 157
12345