Effect of uniaxial anisotropy on anisotropic magnetoresistance: Thickness dependence in bilayer NiO(30 nm)/NiFe(t)

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Kim, D.Y.
Kim, C.G.
Park, B.S.
Hwang, D.G.
Lee, S.S.
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Journal of Applied Physics | 1999年 / 85卷 / 8 pt 2B期
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