Workshop concentrates on mixed-signal test

被引：0
|
作者：
机构：
来源：
Electronic Design | 1995年 / 43卷 / 08期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Test and evaluation of multiple embedded mixed-signal test cores
    Hafed, M
    Roberts, GW
    INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 1022 - 1030
  • [32] MIXED-SIGNAL DESIGN AND TEST - IN COOPERATION WITH THE EUROPEAN TEST CONFERENCE
    SOMA, M
    THATCHER, CW
    WILKINS, B
    MIELKE, JA
    BAKER, K
    SCHNEIDER, B
    OHLETZ, MJ
    MAUNDER, C
    IEEE DESIGN & TEST OF COMPUTERS, 1993, 10 (03): : 80 - 86
  • [33] Test and design-for-test of mixed-signal integrated circuits
    Lubaszewski, M
    Huertas, JL
    INFORMATION TECHNOLOGY: SELECTED TUTORIALS, 2004, 157 : 183 - 212
  • [34] Application of IEEE 1149.1 to mixed-signal measurement and test
    Twigg, R
    NORTHCON/96 - IEEE TECHNICAL APPLICATIONS CONFERENCE, CONFERENCE RECORD, 1996, : 324 - 327
  • [35] A MIXED-SIGNAL TEST PROGRAM-DEVELOPMENT ENVIRONMENT
    RAVN, M
    VLSI SYSTEMS DESIGN, 1987, 8 (09): : 32 - &
  • [36] Statistically Enhanced Analogue and Mixed-Signal Design and Test
    Ramos, Pedro L.
    da Silva, Jose Machado
    Ferreira, Diogo R.
    Santos, Marcelino B.
    PROCEEDINGS OF THE 2016 IEEE 21ST INTERNATIONAL MIXED-SIGNALS TEST WORKSHOP (IMSTW), 2016,
  • [37] A test paradigm for analog and mixed-signal circuits and systems
    Wang, CP
    Hatzopoulos, AA
    Wey, CL
    ISCAS 96: 1996 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS - CIRCUITS AND SYSTEMS CONNECTING THE WORLD, VOL 3, 1996, : 194 - 197
  • [38] Current State of the Mixed-Signal Test Bus 1149.4
    Jari Hannu
    Juha Häkkinen
    Juha-Veikko Voutilainen
    Heli Jantunen
    Markku Moilanen
    Journal of Electronic Testing, 2012, 28 : 857 - 863
  • [39] Strategies and structures for test access in mixed-signal MCMs
    Katoozi, M
    Kutz, H
    Soma, M
    Huynh, S
    1997 IEEE MULTI-CHIP MODULE CONFERENCE - PROCEEDINGS, 1997, : 144 - 149
  • [40] PXI modular instruments target mixed-signal test
    Strassberg, Dan
    EDN, 2003, 48 (20)
12345