Characterization of interface roughness in W/Si multilayers by high resolution diffuse X-ray scattering

被引：0

作者：

Salditt, T. ^{[1
]}

Lott, D. ^{[1
]}

Metzger, T.H. ^{[1
]}

Peisl, J. ^{[1
]}

Vignaud, G. ^{[1
]}

Legrand, J.F. ^{[1
]}

Gruebel, G. ^{[1
]}

Hoghoi, P. ^{[1
]}

Schaerpf, O. ^{[1
]}

机构：

[1] Universitaet Muenchen, Muenchen, Germany

来源：

Physica B: Condensed Matter | 1996年 / 221卷 / 1-4期

关键词：

Number:; 055WMAXI5; Acronym:; -; Sponsor:;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：13 / 17

共 14 条

[1] High resolution X-ray diffraction and X-ray topography study of GaN on sapphire
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[2] High-resolution synchrotron X-ray scattering study of the surface and interface structures of YBa2Cu3Ox thin films
Univ of Durham, Durham, United Kingdom
Phys B Condens Matter, (56-61):
[3] High-resolution X-ray spectroscopy with superconducting tunnel junctions
Physik Department E15, Tech. Universität München, 85748 Garching, Germany
不详
X-Ray Spectrom., 5 (309-311):
[4] Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films
Dept. of Eng. and System Science, Also Nucl. Reactor Div., Nucl. S., Hsinchu, Taiwan
不详
不详
J Phys Chem Solids, 8 (1491-1494):
[5] Elastic strains in GaAs/AlAs quantum dots studied by high resolution x-ray diffraction
Masaryk Univ, Brno, Czech Republic
Solid State Electron, 1-8 (373-377):
[6] High-resolution synchrotron X-ray powder diffraction with a linear position-sensitive detector
Lehmann, M.S.
Christensen, A.N.
Nielsen, M.
Feidenhans'l, R.
Cox, D.E.
Journal of Applied Crystallography, 1988, 21 (06): : 905 - 910
[7] Multiple plasma diagnoses from a five-chord, high energy resolution X-ray spectrometer array
Rice, J.E.
Bombarda, F.
Graf, M.A.
Marmar, E.S.
Terry, J.L.
Wang, Y.
Fusion Engineering and Design, 1997, 34-35 : 159 - 163
[8] Lateral correlation of SiGe Stranski-Krastanow islands on silicon as probed by high resolution x-ray diffraction
Hanke, M. (hanke@physik.uni-halle.de), 1959, American Institute of Physics Inc. (96):
[9] Structure of the microdomain boundaries in RFe6Ge6 (R = Tb, Ho or Er) crystals from diffuse X-ray scattering
Zaharko, O. (zaharko@psi.ch), 1600, (Taylor and Francis Ltd.):
[10] Martensitic relief formation on an electropolished Ni-37 at.% Al(001) surface by diffuse X-ray scattering under grazing angles
Univ of Houston, Houston, United States
Mater Sci Eng A Struct Mater Prop Microstruct Process, (286-290):

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