Recent instrumental developments, including x-ray sources, monochromators, and detectors, and their utilization in experimental procedures are discussed. Applications of ″routine″ x-ray diffraction procedures as well as specialized techniques like residual stress analysis, small-angle scattering, and x-ray topography are illustrated by examples, including biological, metallic, and polymeric materials. The conclusion reached is that the future of x-ray diffraction in the study of materials has been made brighter than ever by the introduction of more intense x-ray sources and continuously improving instrumentation.