MAXIMUM ALLOWABLE PERCENT DEFECTIVE (MAPD) SINGLE SAMPLING INSPECTION BY ATTRIBUTES PLAN.

被引：0

作者：

Soundararajan, V.

机构：

来源：

Journal of Quality Technology | 1975年 / 7卷 / 04期

关键词：

D O I：

10.1080/00224065.1975.11980694

中图分类号：

学科分类号：

摘要：

Single Sampling Attributes Plans indexed by Maximum Allowable Percent Defectives (MAPD) are given. A table, for transition from one set of parameters to match the Operating Characteristic Curve (OC curve) to other similar sets, is given.

引用

页码：173 / 182

共 25 条

[21] An Application of Time Truncated Single Acceptance Sampling Inspection Plan Based on Generalized Half-Normal Distribution
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[22] Correction to: An Application of Time Truncated Single Acceptance Sampling Inspection Plan Based on Generalized Half‑Normal Distribution
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Annals of Data Science, 2021, 8 (1) : 183 - 183
[23] SELECTION OF SINGLE SAMPLING ATTRIBUTES PLAN FOR GIVEN ACCEPTABLE QUALITY LEVEL AND LIMITING QUALITY LEVEL INVOLVING MINIMUM RISKS
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[24] Procedure for the selection of CSP-M one-level skip-lot sampling inspection plans that have a single-sampling plan with acceptance number zero as the reference plan
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[25] Empirical approach for single attributes sampling plans design under normal inspection based on standards COVENIN 3133-1:2001 and MIL-STD-105E
Rodriguez-Balza, Mairett
Perez-Ybarra, Luis
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ENFOQUE UTE, 2015, 6 (02): : 77 - 85

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