USING FUNCTIONAL TESTERS FOR FIELD SERVICE.

被引：0

作者：

Goldberg, Robert

机构：

来源：

Electronic Packaging and Production | 1980年 / 20卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TN7 [基本电子电路];

学科分类号：

080902 ;

摘要：

A number of factors are presented which point out the effectiveness of functional testers for field use in IC testing. The desirable characteristics of a field tester are shown to be opposite to those of a typical production line tester.

引用

页码：119 / 128