OPTICAL BEAM INDUCED CURRENT IMAGING OF DISLOCATIONS IN SEMICONDUCTORS.

被引：0
作者：
Wilson, T. [1 ]
McCabe, E.M. [1 ]
机构：
[1] Univ of Oxford, Engl, Univ of Oxford, Engl
来源：
Optik (Jena) | 1986年 / 75卷 / 01期
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摘要：
SEMICONDUCTOR DEVICES, SCHOTTKY BARRIER
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页码：11 / 15
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