OPTICAL BEAM INDUCED CURRENT IMAGING OF DISLOCATIONS IN SEMICONDUCTORS.

被引：0

|

作者：

Wilson, T. ^{[1
]}

McCabe, E.M. ^{[1
]}

机构：

[1] Univ of Oxford, Engl, Univ of Oxford, Engl

来源：

Optik (Jena) | 1986年 / 75卷 / 01期

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摘要：

SEMICONDUCTOR DEVICES, SCHOTTKY BARRIER

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页码：11 / 15

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