Morphology and in situ deformation of polyamide films investigated with scanning force microscopy

被引：0
|
作者：
Westfaelische Wilhelms-Universitaet, Muenster, Muenster, Germany [1 ]
机构：
来源：
Surf Interface Anal | / 7-8卷 / 537-542期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
17
引用
收藏
相关论文
共 50 条
  • [1] Morphology and in situ deformation of polyamide films investigated with scanning force microscopy
    Drechsler, D
    Karbach, A
    Fuchs, H
    SURFACE AND INTERFACE ANALYSIS, 1997, 25 (7-8) : 537 - 542
  • [2] SURFACE-MORPHOLOGY AND ROUGHNESS OF TIO2 THIN-FILMS INVESTIGATED WITH SCANNING FORCE MICROSCOPY
    GUTMANNSBAUER, W
    HAEFKE, H
    RUETSCHI, M
    GUNTHERODT, HJ
    STAUB, J
    BANGE, K
    HELVETICA PHYSICA ACTA, 1993, 66 (7-8): : 877 - 878
  • [3] STRUCTURE AND STABILITY OF LANGMUIR-BLODGETT-FILMS INVESTIGATED BY SCANNING FORCE MICROSCOPY
    CHI, LF
    ENG, LM
    GRAF, K
    FUCHS, H
    LANGMUIR, 1992, 8 (09) : 2255 - 2261
  • [4] DEFECT STRUCTURES OF LANGMUIR-BLODGETT-FILMS INVESTIGATED BY SCANNING FORCE MICROSCOPY
    FUCHS, H
    CHI, LF
    ENG, LM
    GRAF, K
    THIN SOLID FILMS, 1992, 210 (1-2) : 655 - 658
  • [5] Morphology of dual beam ion sputtered films investigated by atomic force microscopy
    Lee, CC
    Hsu, JC
    Wei, DT
    Lin, JH
    THIN SOLID FILMS, 1997, 308 : 74 - 78
  • [6] In situ observation of surface deformation of polymer films by atomic force microscopy
    Nishino, T
    Nozawa, A
    Kotera, M
    Nakamae, K
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (05): : 2094 - 2096
  • [7] Kinetics of ferroelectric domains investigated by scanning force microscopy
    Likodimos, V
    Labardi, M
    Allegrini, M
    PHYSICAL REVIEW B, 2000, 61 (21): : 14440 - 14447
  • [8] In situ morphology of cationic flocculants adsorbed on surfaces and their interaction forces investigated by atomic force microscopy
    Arita, T
    Kanda, Y
    Hamabe, H
    Ueno, T
    Watanabe, Y
    Higashitani, K
    LANGMUIR, 2003, 19 (17) : 6723 - 6729
  • [9] Deformation and Hyperfine Structures of Dendrimers Investigated by Scanning Tunneling Microscopy
    Fleming, Christopher J.
    Liu, Ying X.
    Deng, Zhao
    Liu, Gang-yu
    JOURNAL OF PHYSICAL CHEMISTRY A, 2009, 113 (16): : 4168 - 4174
  • [10] Characterization of polyamide thin films by atomic force microscopy
    McIntee, Olivia M.
    Sreedhar, Nurshaun
    Welch, Brian C.
    Bright, Victor M.
    Roy, Abhishek
    Paul, Mou
    Greenberg, Alan R.
    POLYMER, 2024, 308
12345