Femtosecond laser ablation of sapphire: Time-of-flight analysis of ablation plume

被引：0
|
作者：
Varel, H. [1 ]
Waehmer, M. [1 ]
Rosenfeld, A. [1 ]
Ashkenasi, D. [1 ]
Campbell, E.E.B. [1 ]
机构：
[1] Max-Born-Inst fuer Nichtlineare, Optik und Kurzzeitspektroskopie, Berlin, Germany
来源：
Applied Surface Science | 1998年 / 127-129卷
关键词：
Ion exchange - Mass spectrometry - Pulsed laser applications - Sapphire - Ultrafast phenomena;
D O I：
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中图分类号：
学科分类号：
摘要：
Time-of-flight mass spectrometry has been used to investigate the mass and velocity distributions of positive ions produced on laser ablation of sapphire with ultrashort (200 fs) laser pulses at a wavelength of 790 nm. Aluminum and oxygen ions were observed with the proportion of singly and doubly charged oxygen ions increasing with increasing number of laser shots for a given laser fluence. The ions have extremely high kinetic energies which is attributed to Coulomb explosion from charged defect sites.
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页码：128 / 133
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