V. L. S. I. DESIGN FOR TESTABILITY.

被引：0

作者：

Chung Ho Chen

机构：

来源：

New Electronics | 1980年 / 13卷 / 06期

关键词：

INTEGRATED CIRCUITS - Large Scale Integration;

D O I：

暂无

中图分类号：

TN7 [基本电子电路];

学科分类号：

080902 ;

摘要：

The testability requirements of v. l. s. i. integrated circuits are analyzed and the design principles are presented that are necessary and sufficient for testable logic design.

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