Atomic force microscopy of single-walled carbon nanotubes using carbon nanotube tip

被引：0

作者：

Choi, Nami ^{[1
]}

Uchihashi, Takayuki ^{[1
]}

Nishijima, Hidehiro ^{[2
]}

Ishida, Takao ^{[3
,4
]}

Mizutani, Wataru ^{[3
]}

Akita, Seiji ^{[2
]}

Nakayama, Yoshikazu ^{[2
]}

Ishikawa, Mitsuru ^{[1
]}

Tokumoto, Hiroshi ^{[3
]}

机构：

[1] Jt. Res. Center for Atom Technology, Angstrom Technology Partnership, 1-1-4 Higashi, Tsukuba, Ibaraki 305-0046, Japan

[2] Dept. of Physics and Electronics, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka 599-8531, Japan

[3] JRCAT, Natl. Inst. for Adv. Interdisc. Res., 1-1-4 Higashi, Tsukuba, Ibaraki 305-8562, Japan

[4] Precursory Res. Embryonic Sci. T., Japan Sci. and Technol. Cooperation, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2000年 / 39卷 / 6 B期

关键词：

Amines - Atomic force microscopy - Carbon - Optical resolving power;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We succeeded in observing individual single-walled carbon nanotubes (SWNTs) using an atomic force microscope (AFM) in the tapping mode by paying attention to the preparation of both samples and AFM tips. To disentangle the bundles of SWNTs, we added a small amount of amine into N,N-dimethylformamide. To achieve a high resolution in tapping-mode AFM imaging, we used carbon nanotube (CNT) tips whose radii could be reduced. We were able to image individual SWNTs using CNT tips with widths that were half of those imaged using conventional silicon tips. With this improved resolution, we could clearly resolve the two SWNTs lying parallel on a mica substrate.

引用

页码：3707 / 3710