Application of the Reflectivity of X-Rays to Study Surfaces.

被引：0
|
作者：
Bosio, L
Cortes, R.
Defrain, A.
Gomas da Costa, P.
机构：
来源：
Vide, les Couches Minces | 1983年 / 38卷 / 216期
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学科分类号：
摘要：
SURFACES
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页码：197 / 198
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