Analysis of oxide breakdown mechanism occurring during ESD pulses

被引：0
|
作者：
Leroux, C. [1 ]
Andreucci, P. [1 ]
Reimbold, G. [1 ]
机构：
[1] LETI (CEA - Technologies Avancees), Grenoble, France
来源：
Annual Proceedings - Reliability Physics (Symposium) | 2000年
关键词：
Electrostatic discharges;
D O I：
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摘要：
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页码：276 / 282
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