ON THE FABRICATION AND ADJUSTMENT PRECISION OF THE SPECTROMETER MECHANISM OF AN X-RAY MICROANALYZER.

被引：0

作者：

Solov'ev, A.M.

Krupchatkin, V.D.

Toporkov, S.A.

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来源：

Soviet Journal of Optical Technology (English translation of Optiko-Mekhanicheskaya Promyshlennost) | 1974年 / 41卷 / 09期

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摘要：

The question of the required precisions for fabricating the elements of a full-focusing spectrometer and its orientation with respect to the radiation source is examined. The necessary adjustments of the spectrometer mechanism to achieve its best x-ray-optical parameters are defined.

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页码：419 / 420