DETERMINATION OF MICROQUANTITIES OF SUBSTANCES BY THE LASER ATOMIC - ABSORPTION METHOD.

被引：0
作者：
Burakov, V.S.
Misakov, P.Ya.
Nechaev, S.V.
Yankovskii, A.A.
机构：
来源：
Journal of Applied Spectroscopy (English Translation of Zhurnal Prikladnoi Spektroskopii) | 1974年 / 21卷 / 06期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1597 / 1602
相关论文
共 50 条
[31]   DETERMINATION OF MERCURY BY DITHIZONE METHOD AND ATOMIC-ABSORPTION [J].
ERARD, M ;
MISEREZ, A .
CHIMIA, 1973, 27 (01) :23-23
[32]   DETERMINATION OF COPPER IN STEELS BY ATOMIC-ABSORPTION METHOD [J].
BEGAK, OY ;
NIKOLAEV, GI ;
POKROVSKAYA, KA .
JOURNAL OF APPLIED CHEMISTRY OF THE USSR, 1974, 47 (08) :1760-1762
[33]   DETERMINATION OF THE ISOTROPIC COMPOSITION OF LITHIUM BY THE ATOMIC ABSORPTION METHOD [J].
ZAIDEL, AN ;
KORENNOI, EP .
INDUSTRIAL LABORATORY, 1963, 29 (12) :1617-1618
[34]   DETERMINATION OF MICROQUANTITIES OF SULFATES BY METHOD OF FILM POLAROGRAPHY WITH ACCUMULATION [J].
ROIZENBL.EM ;
FOMICHEV.TI ;
BRAININA, KZ .
INDUSTRIAL LABORATORY, 1966, 32 (06) :799-&
[35]   DETERMINATION OF MICROQUANTITIES OF URANIUM BY LUMINESCENCE, EXCITED BY LASER-RADIATION [J].
SOKOLOV, AK ;
SOKOLOV, MM ;
TITOV, VK .
JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1982, 37 (08) :1132-1134
[36]   INFLUENCE OF OXYACIDS AND OTHER SUBSTANCES ON THE ATOMIC-ABSORPTION DETERMINATION OF MAGNESIUM IN NONFERROUS ALLOYS [J].
PILIPYUK, YS ;
ISHCHENKO, VB ;
SOLOSHONOK, VV ;
PYATNITSKY, IV .
UKRAINSKII KHIMICHESKII ZHURNAL, 1987, 53 (08) :847-851
[37]   ATOMIC-ABSORPTION SPECTROMETRIC METHOD FOR THE DETERMINATION OF NONIONIC SURFACTANTS [J].
CRISP, PT ;
ECKERT, JM ;
GIBSON, NA .
ANALYTICA CHIMICA ACTA, 1979, 104 (01) :93-98
[38]   INDIRECT ATOMIC-ABSORPTION SPECTROPHOTOMETRIC METHOD FOR THE DETERMINATION OF NITRATE [J].
ANWAR, J ;
TANVEERULHAQUE .
JOURNAL OF THE CHEMICAL SOCIETY OF PAKISTAN, 1985, 7 (03) :209-213
[39]   The determination of the concentration of trace elements in silicon by the atomic absorption method [J].
N. P. Muravskaya ;
Ya. I. Ermakova ;
A. V. Ivanov .
Measurement Techniques, 2012, 54 :1303-1312
[40]   THE DETERMINATION OF THE CONCENTRATION OF TRACE ELEMENTS IN SILICON BY THE ATOMIC ABSORPTION METHOD [J].
Muravskaya, N. P. ;
Ermakova, Ya. I. ;
Ivanov, A. V. .
MEASUREMENT TECHNIQUES, 2012, 54 (11) :1303-1312
12345